Nicole Kerness
Post-doctoral Student

Nicole Kerness

EDUCATION: 

  • B.S. in Engineering Physics, Rensselaer Polytechnic Institute, Troy, NY, USA, 1992
  • M.S. in Nuclear Science and Engineering, Cornell University, Ithaca, NY, USA, 1995
  • Ph.D. in Electrical Engineering Swiss Federal Institute of Technology, Zurich, Switzerland, 2002

WORK EXPERIENCE:

  • May 1995 - Sept 1998: Lockheed Martin Federal Systems, Owego, NY, Radiation effects on electronics and MEMS accelerometer applications
  • March 1992 - May 1992: InterScience Inc., Troy, NY, Electron beam focusing, consultant

RESEARCH INTERESTS:

  • Oxygen microsensors
  • Biological and chemical sensors for space flight instrumentation, air and water monitoring, and human physiological monitoring Calorimetric chemical microsensors
  • CMOS based Micro Electromechanical Sensors (CMOS MEMS)
  • MEMS-based inertial navigation sensors

PUBLICATIONS

  • N. Kerness, S. Taschini, D. Jacobi, C. Hagleitner, A. Hierlemann, D. Lange, J. Korvink, O. Brand, and H. Baltes, "CMOS-based Calorimetric Chemical Microsensors", IEEE J. MEMS, (submitted).
  • G.J. Mohr, G. Zhylyak, T. Nezel, U.E. Spichiger-Keller, N. Kerness, O. Brand, H. Baltes, U.-W. Grummt, "Using reactands in CMOS-based calorimetric sensors: new functional materials for electronic noses", Analytical Sciences 18 (2002) 109-111.
  • N. Kerness, C. Hagleitner, S. Taschini, D. Lange, O. Brand, J.G. Korvink, H. Baltes, "Calorimetric chemical microsensor for space station air quality monitoring", Proc. Nanospace (2002).
  • N. Kerness, C. Hagleitner, O. Brand, D. Lange, and H. Baltes, "Modeling of Absorption Heat Sensitivities of CMOS Calorimetric Gas Sensors", IMCS 2002, Boston, USA, (2002).
  • C. Hagleitner, D. Lange , N. Kerness, A. Kummer, W.H. Song, A. Hierlemann, O. Brand, and H. Baltes, "CMOS Single-Chip Multisensor Gas Detection System", Techn. Digest IEEE Micro Electro Mechanical Systems (MEMS) '02, pp. 244-247, (2002).
  • C. Hagleitner, A. Hierlemann, D. Lange, A. Kummer, N. Kerness, O. Brand, and H. Baltes, "Smart Single-Chip Gas Sensor Microsystem", Nature, (2001), Vol 414, 293-296.
  • M.Frank, N. Kerness, S. Raible, C. Hagleitner, U. Weimar, and H. Baltes, "New Coating Procedure for CMOS Chemical Microsensors, presented at the ISOEN'01, Washington, D.C., USA, (2001).
  • N. Kerness, C. Hagleitner, A. Koll, A. Hierlemann, O. Brand, and H. Baltes, "CMOS Calorimetric Gas Sensors", IMCS 2000, Basel, Switzerland, (2000).
  • N. Kerness, A. Koll, A. Schaufelbuehl, C. Hagleitner, A. Hierlemann, O. Brand, and H. Baltes, "N-well Based CMOS Calorimetric Chemical Sensors", IEEE Micro Electro Mechanical Systems 2000, Myazaki, Japan, (2000), 96-101, ISBN 0-7803-5273-4.
  • Hierlemann, A. Koll, D. Lange, C. Hagleitner, N. Kerness, O. Brand, and H. Baltes, "Application-Specific Sensor Systems Based on CMOS Chemical Microsensors", Sensors and Actuators B, vol 70, p 2-11, (2000).
  • Hierlemann, A. Koll, D. Lange, C. Hagleitner, N. Kerness, O. Brand, R. Vogt, H. Baltes, "CMOS based chemical microsensors: Components of a micronose system", Proc. SPIE, vol. 3857, pp. 158-169, (1999).
  • N. D. Kerness and A. H. Taber, "Neutron SEU Trends in Avionics", 1997 IEEE Nuclear and Space Radiation Effects Data Workshop, Snowmass, Colorado, USA, Cat. No.97TH8293, IEEE, New York, NY, USA, vi+129 p 67-72, (1997).
  • N. D. Kerness, A. H. Taber, and L. F. White "Influence on Memory Size and Type on NSEU Rates", NASA/SEMATECH/SRC 1st Symposium on Soft Errors, Radiation Effects, and Reliability in VLSI: Terrestrial Applications, October (1997).
  • N. D. Kerness, T. Z. Hossain, and S. C. McGuire, "Impurity Study of Alumina and Aluminum Nitride Ceramics: Microelectronics Packaging Applications", Applied Radiation and Isotopes, vol. 48, No. 1, p 5-9, (1997).
  • S.C. McGuire, T.Z. Hossain, C. Golkowski, N. D. Kerness, and J.D. Sulcer, "Applications of Neutron Activation to Microelectronics Materials Research at the Cornell TRIGA Reactor", Journal of Radioanalytical Chemistry, (1995).
  • S.C. McGuire, T.Z. Hossain, N.D. Kerness, and J.D. Sulcer, "Multielement Matrix Analysis Using Reactor Spectrum Neutrons", presented at the 6th International Symposium on Radiation Physics, July 18-22, 1994, Rabat, Morocco, Applied Radiation and Isotopes Journal, Elsevier Science, Ltd. (1995).

AWARDS AND HONORS:

  • McMullen fellowship, Cornell University, Ithaca, NY, USA, 1992-95
  • Technical Vitality Recognition, Lockheed Martin Federal Systems (LMFS), Owego, NY, USA, 1997

OTHER LINKS:  

 

CONTACT INFORMATION:

Silicon Microstructure Inc.
1701 McCarthy Blvd.
Milpitas, CA 95035 

Tel.: (408) 577-0100
Email: Nicole.Kerness_at_si-micro.com